Invention Grant
- Patent Title: Eye-fatigue examining device and eye-fatigue examining method
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Application No.: US16085595Application Date: 2017-02-20
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Publication No.: US10959615B2Publication Date: 2021-03-30
- Inventor: Takashi Fujikado , Masakazu Hirota , Kohji Nishida , Makoto Saika , Tatsuo Yamaguchi , Suguru Miyagawa
- Applicant: OSAKA UNIVERSITY , TOPCON CORPORATION
- Applicant Address: JP Osaka; JP Tokyo
- Assignee: OSAKA UNIVERSITY,TOPCON CORPORATION
- Current Assignee: OSAKA UNIVERSITY,TOPCON CORPORATION
- Current Assignee Address: JP Osaka; JP Tokyo
- Agency: Xsensus LLP
- Priority: JPJP2016-055553 20160318
- International Application: PCT/JP2017/006177 WO 20170220
- International Announcement: WO2017/159225 WO 20170921
- Main IPC: A61B3/113
- IPC: A61B3/113 ; A61B3/10 ; A61B3/08 ; A61B3/00

Abstract:
An eye-fatigue examining device and an eye-fatigue examining method capable of examining eye fatigue of a subject's eye regardless of an age of a patient are provided. The eye-fatigue examining device includes: a light quantity difference adjusting unit that increases a light quantity difference between lights respectively incident on right and left subject's eyes; a gaze direction detecting unit that detects gaze directions of the respective subject's eyes while the light quantity difference adjusting unit increases the light quantity difference; and a light quantity difference deciding unit that decides a specific light quantity difference at which a change in the gaze directions due to the increase in the light quantity difference occurs, based on the detection result of the gaze direction detecting unit.
Public/Granted literature
- US20190099076A1 EYE-FATIGUE EXAMINING DEVICE AND EYE-FATIGUE EXAMINING METHOD Public/Granted day:2019-04-04
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