Invention Grant
- Patent Title: Inspection system with source of radiation and method
-
Application No.: US16321194Application Date: 2017-07-27
-
Publication No.: US10962677B2Publication Date: 2021-03-30
- Inventor: Guillaume Jegou
- Applicant: SMITHS HEIMANN SAS
- Applicant Address: FR Vitry sur Seine
- Assignee: SMITHS HEIMANN SAS
- Current Assignee: SMITHS HEIMANN SAS
- Current Assignee Address: FR Vitry sur Seine
- Agency: Advent, LLP
- Agent Kevin E. West
- Priority: GB1613069.2 20160728
- International Application: PCT/GB2017/052198 WO 20170727
- International Announcement: WO2018/020257 WO 20180201
- Main IPC: G01V5/00
- IPC: G01V5/00 ; H05G2/00 ; G01N23/10 ; G01N23/04 ; G01N23/06 ; G21K1/02 ; H01J35/00
Abstract:
In examples, it is disclosed an inspection system comprising: a secondary source of radiation configured to generate secondary electromagnetic radiation for inspection of a load in response to being irradiated by primary electromagnetic radiation from a primary generator of electromagnetic radiation; and one or more detectors configured to detect radiation from the load after interaction with the secondary inspection beam.
Public/Granted literature
- US20190219730A1 INSPECTION SYSTEM WITH SOURCE OF RADIATION AND METHOD Public/Granted day:2019-07-18
Information query
