Invention Grant
- Patent Title: Head device of three-dimensional modelling equipment having modelling light source array and polygonal mirror, and modelling plane scanning method using same
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Application No.: US15543052Application Date: 2016-01-11
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Publication No.: US10962769B2Publication Date: 2021-03-30
- Inventor: Seung Taek Kim , Moon Soo Park , Jong Seok Kim , Hyung Tae Kim
- Applicant: KOREA INSTITUTE OF INDUSTRIAL TECHNOLOGY
- Applicant Address: KR Cheonan-si
- Assignee: KOREA INSTITUTE OF INDUSTRIAL TECHNOLOGY
- Current Assignee: KOREA INSTITUTE OF INDUSTRIAL TECHNOLOGY
- Current Assignee Address: KR Cheonan-si
- Agency: Rabin & Berdo, P.C.
- Priority: KR10-2015-0004141 20150112
- International Application: PCT/KR2016/000224 WO 20160111
- International Announcement: WO2016/114531 WO 20160721
- Main IPC: G02B26/12
- IPC: G02B26/12 ; B33Y30/00 ; B29C67/00 ; B29C64/264 ; G01B5/00 ; G01B11/00 ; G01B11/25 ; G02B26/10 ; G06K9/32 ; H04N1/113

Abstract:
The present invention relates to a head device of a three-dimensional modelling equipment, and a modelling plane scanning method using the same, the head device of a three-dimensional modelling equipment comprising: a modelling light source array having a plurality of modelling light sources; a light guide part, installed at a given position above a modelling plane, having a function of reflecting modelling rays from the modelling light source array so as to be incident on the modelling plane; and a controller for controlling the operations of the modelling light source array and the light guide part in a conjoined manner, wherein a plurality of modelling rays generated from the plurality of modelling light sources are irradiated while forming one line scan having a first axial direction on the modelling plane, and the light guide part continuously or intermittently moves the one line scan on the modelling plane to irradiate the modelling light rays across the modelling plane. The present invention has the effects of enabling high-speed scanning to be performed, and modelling precision to be enhanced through precise scanning control.
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