An applicator repair system for an additive manufacturing (AM) system, and an AM system including the same are disclosed. The applicator repair system includes a repair device including a repair element configured to repair a damaged applicator element on an applicator of an AM system. The damaged applicator element is configured to distribute a layer of raw material on a build platform of the AM system. The repair device is positioned within a processing chamber of the AM system. A damaged applicator controller may be provided that is configured to cause repair of the damaged active applicator in response to the damaged applicator being identified as damaged.