Invention Grant
- Patent Title: Memory devices with multiple sets of latencies and methods for operating the same
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Application No.: US16048078Application Date: 2018-07-27
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Publication No.: US10976945B2Publication Date: 2021-04-13
- Inventor: Dean D. Gans , Yoshiro Riho , Shunichi Saito , Osamu Nagashima
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: G06F3/00
- IPC: G06F3/00 ; G06F3/06 ; G11C7/10 ; G06F13/16

Abstract:
Methods, systems, and apparatuses related to memory operation with multiple sets of latencies are disclosed. A memory device or system that includes a memory device may be operable with one or several sets of latencies (e.g., read, write, or write recovery latencies), and the memory device or system may apply a set of latencies depending on which features of the memory device are enabled. For example, control circuitry may be configured to enable one or more features during operations on a memory array, and the control circuitry may apply a set of latency values based on a number or type of features that are enabled. The sets of latency values may depend, for example, on whether various control features (e.g., dynamic voltage frequency scaling) are enabled, and a device may operate within certain frequency ranges irrespective of other characteristics (e.g., mode register values) or latencies applied.
Public/Granted literature
- US20190129637A1 MEMORY DEVICES WITH MULTIPLE SETS OF LATENCIES AND METHODS FOR OPERATING THE SAME Public/Granted day:2019-05-02
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