Invention Grant
- Patent Title: Method and device for measuring antenna reflection coefficient
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Application No.: US16599641Application Date: 2019-10-11
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Publication No.: US10979089B2Publication Date: 2021-04-13
- Inventor: Daeyoung Kim , Youngik Cho
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2018-0148764 20181127,KR10-2019-0039743 20190404
- Main IPC: H04B17/00
- IPC: H04B17/00 ; H04B1/04 ; G01R27/06 ; H04B17/12 ; H04B17/10 ; H03H7/38

Abstract:
A device for measuring a reflection coefficient of an antenna by using a radio frequency (RF) feedback signal provided by a coupler based on an RF transmission signal provided to the antenna includes a feedback circuit configured to generate a baseband feedback signal by down-converting and filtering the RF feedback signal, and a signal processing device configured to control the down-converting, based on a target frequency band, process a baseband transmission signal and the baseband feedback signal to have the target frequency band, and calculate a reflection coefficient of the antenna corresponding to the target frequency band. The RF transmission signal is generated from the baseband transmission signal.
Public/Granted literature
- US20200169276A1 METHOD AND DEVICE FOR MEASURING ANTENNA REFLECTION COEFFICIENT Public/Granted day:2020-05-28
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