A method for evaluating crystal defects by which a distribution of the crystal defects present in a silicon wafer is evaluated, includes forming an oxide film having a thickness equal to a crystal defect size to be evaluated on the silicon wafer, measuring GOI characteristics of the silicon wafer, and obtaining the distribution of the crystal defects having the crystal defect size to be evaluated in the silicon wafer from a measurement result of the GOI characteristics on a supposition that the crystal defects whose size is equivalent to the thickness of the oxide film are present in a region where the GOI characteristics are degraded. Consequently, the method for evaluating crystal defects by which a distribution of the crystal defects can be obtained even if a crystal defect size is 10 nm or less.