Invention Grant
- Patent Title: Test device and test method
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Application No.: US16338617Application Date: 2018-11-02
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Publication No.: US10991291B2Publication Date: 2021-04-27
- Inventor: Xueguang Hao , Yong Qiao , Xinyin Wu
- Applicant: BOE TECHNOLOGY GROUP CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: The Webb Law Firm
- Priority: CN201820419392.9 20180327
- International Application: PCT/CN2018/113748 WO 20181102
- International Announcement: WO2019/184351 WO 20191003
- Main IPC: G09G3/20
- IPC: G09G3/20 ; G01R31/26

Abstract:
The present disclosure provides a test device and a test method. The test device includes a first circuit, a second circuit and a third circuit. The first circuit drives a first pixel to emit light by using a first set of test signals according to the control of a first switch signal and a second switch signal, the second circuit drives a second pixel to emit light by using the first set of test signals according to the control of the first switch signal and the second switch signal, and the third circuit drives a third pixel to emit light by using a second set of test signals according to the control of the first switch signal or the second switch signal, wherein the first pixel, the second pixel and the third pixel are mutually different.
Information query