Invention Grant
- Patent Title: Charged particle beam device
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Application No.: US16477986Application Date: 2017-01-27
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Publication No.: US10991542B2Publication Date: 2021-04-27
- Inventor: Ryota Watanabe , Yuko Sasaki , Kazunari Asao , Makoto Suzuki , Wataru Mori , Minoru Yamazaki
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- International Application: PCT/JP2017/002968 WO 20170127
- International Announcement: WO2018/138875 WO 20180802
- Main IPC: H01J37/22
- IPC: H01J37/22 ; H01J37/244 ; H01J37/10 ; H01J37/28

Abstract:
The purpose of the present invention is to provide a charged particle beam device which adjusts brightness and contrast or adjusts focus and the like appropriately in a short time even if there are few detected signals. Proposed as an aspect for achieving this purpose is a charged particle beam device provided with: a detector for detecting charged particles obtained on the basis of irradiation of a specimen with a charged particle beam emitted from a charged particle source; and a control unit for processing a signal obtained on the basis of the output of the detector, wherein the control unit performs statistical processing on gray level values in a predetermined region of an image generated on the basis of the output of the detector, and executes signal processing for correcting a difference between a statistical value obtained by the statistical processing and reference data relating to the gray level values of the image.
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