- 专利标题: Method for calibrating instrument provided with IC tag unit
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申请号: US16300007申请日: 2016-05-09
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公开(公告)号: US11015963B2公开(公告)日: 2021-05-25
- 发明人: Iwao Kobata , Yoshiyuki Nakai
- 申请人: KOBATA GAUGE MFG. CO., LTD.
- 申请人地址: JP Osaka
- 专利权人: KOBATA GAUGE MFG. CO., LTD.
- 当前专利权人: KOBATA GAUGE MFG. CO., LTD.
- 当前专利权人地址: JP Osaka
- 代理机构: Michael Best & Friedrich LLP
- 国际申请: PCT/JP2016/063758 WO 20160509
- 国际公布: WO2017/195251 WO 20171116
- 主分类号: G01D11/26
- IPC分类号: G01D11/26 ; G01D18/00 ; G08C17/02 ; G01D7/00 ; H04Q9/00
摘要:
An IC unit includes a scale increment reading module that is configured to: detect, when an indicator in an instrument rotates, rotation of the indicator, and convert the rotation into rotation data; and an antenna that is configured to transmit the rotation data wirelessly from the IC tag unit to a reader. The instrument includes a scale plate, scale increments on the scale plate remain viewable when the IC tag unit is affixed to the instrument. The instrument includes a transparent cover plate, the IC tag unit is affixed to the transparent cover plate when the IC tag unit is affixed to an instrument. The IC tag unit is calibrated by rotating the IC tag unit until an indicating portion of the indicator overlaps a first pointer on the scale plate.
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