Invention Grant
- Patent Title: Self-evaluating array of memory
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Application No.: US16774505Application Date: 2020-01-28
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Publication No.: US11037650B2Publication Date: 2021-06-15
- Inventor: Alper Buyuktosunoglu , Swagath Venkataramani , Rajiv Joshi , Karthik V. Swaminathan , Schuyler Eldridge , Pradip Bose
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Heather Johnston
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/50 ; G06N3/063 ; G06N3/04 ; G06N3/08

Abstract:
A first voltage may be applied to a memory in a neural network. The memory may include one or more memory cells. A processor may determine that a first memory cell in the memory is faulty at the first voltage. The first voltage may be a low voltage. The processor may identify a first factor in the neural network. The first factor may have a low criticality in the neural network. The processor may determine to store the first factor in the first memory cell. The processor may store the first factor in the first memory cell.
Public/Granted literature
- US20200168290A1 SELF-EVALUATING ARRAY OF MEMORY Public/Granted day:2020-05-28
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