- 专利标题: Method and arrangement for increasing a throughput in workpiece measurement
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申请号: US16292283申请日: 2019-03-04
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公开(公告)号: US11047669B2公开(公告)日: 2021-06-29
- 发明人: Tom Gruenewald
- 申请人: Carl Zeiss Industrielle Messtechnik GmbH
- 申请人地址: DE Oberkochen
- 专利权人: Carl Zeiss Industrielle Messtechnik GmbH
- 当前专利权人: Carl Zeiss Industrielle Messtechnik GmbH
- 当前专利权人地址: DE Oberkochen
- 代理机构: Ewers IP Law PLLC
- 代理商 Falk Ewers
- 优先权: EP18160062 20180305
- 主分类号: G01B5/008
- IPC分类号: G01B5/008 ; G01B5/012 ; G01B3/00 ; G01B11/00 ; G01B21/04 ; G05B19/401
摘要:
A method and an arrangement for increasing the throughput in a workpiece measurement with a coordinate measuring machine (CMM) is provided. The CMM measures a workpiece, and the measurement is described by at least one measurement parameter, a value of which is variable. The method includes setting an initial value of the at least one measurement parameter, the initial value being a predetermined value of the at least one measurement parameter valid for measuring the workpiece, measuring the workpiece with the initial value, determining a value of at least one predetermined test characteristic based on results of the measuring of the workpiece, determining whether the at least one predetermined test characteristic satisfies a predetermined iteration criterion; and changing the initial value of the at least one measurement parameter and repeating the prior steps upon determining that the at least one test characteristic satisfies the predetermined iteration criterion.
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