公开(公告)号：US12154260B2

公开(公告)日：2024-11-26

申请号：US18215739

申请日：2023-06-28

Applicant: Carl Zeiss Industrielle Messtechnik GmbH

Inventor： Christian Schleith ,  Stefan Dieball ,  Béla Pontai

IPC: G06T7/00 ,  H04N23/56 ,  H04N23/695 ,  H04N23/90

Abstract: A surface inspection system for capturing surface defects of a surface to be checked, includes a camera system, an illumination system including one or more light sources, and an evaluation system. The evaluation system evaluates a brightness and/or color distribution of the surface to be checked in at least one image captured by the camera system and captures surface defects of the surface to be checked as local deviations in the brightness and/or color. The evaluation system is configured to assess a local deviation in the brightness and/or color as a surface defect when the local deviation appears brighter in at least one first subregion and darker in at least one second subregion than a surface region surrounding the local deviation, and/or different colors are dominant in different subregions.

公开(公告)号：US12140411B2

公开(公告)日：2024-11-12

申请号：US16726855

申请日：2019-12-25

Applicant: Carl Zeiss Industrielle Messtechnik GmbH

Inventor： Volker Greifzu ,  Uwe Holz ,  Nils Haverkamp ,  Ulrike Zeiser

IPC: G01B11/00 ,  G01B7/008 ,  G01B21/04

Abstract: A standard for calibrating a coordinate measuring machine includes a main body with a permanent calibration structure. The calibration structure includes a first arrangement. The first arrangement is configured in such a way that three axes of a projection of the first arrangement on a plane, the axes intersecting at a common point, each run over an identically configured first portion. The first portions are each delimited by the common point on one side. The identically configured first portions each have n zones. Directly adjacent zones differ in one optical property. In various implementations, n is greater than or equal to 3.

公开(公告)号：US12000694B2

公开(公告)日：2024-06-04

申请号：US17201912

申请日：2021-03-15

Applicant: Carl Zeiss Industrielle Messtechnik GmbH

Inventor： Thomas Guth ,  Annett Froewis ,  Birgit Huber ,  Günter Haas ,  Ana Carolina Mayr Adam

IPC: G01B21/20

CPC classification number: G01B21/20

Abstract: A computer-implemented method automatically produces a test plan for measuring a measured object. The method includes obtaining a desired dataset of the measured object. The method includes providing a starting pattern. The providing comprises producing a division. The producing the division comprises applying at least one division function. The division has a plurality of division indices. The method includes producing a target pattern by generating a comparison between the desired dataset and the division. At least one division index is adapted in response to a deviation of the division from the desired dataset. The method includes creating at least one element with at least one piece of pattern information in the test plan in accordance with the target pattern.

公开(公告)号：US20240176313A1

公开(公告)日：2024-05-30

申请号：US18435977

申请日：2024-02-07

Applicant: Carl Zeiss Industrielle Messtechnik GmbH

Inventor： Jonas Frank

IPC: G05B13/04 ,  G01B5/012 ,  G01B11/00 ,  G06F17/18 ,  G06F30/20

CPC classification number: G05B13/041 ,  G01B5/012 ,  G01B11/005 ,  G06F17/18 ,  G06F30/20

Abstract: A method for selecting a measurement sequence for a coordinate measuring machine includes obtaining multiple surface regions of an object to be measured by at least one measurement sensor in respect of at least one predetermined property. The measurement sensor is arranged by the coordinate measuring machine at at least one specific position and/or with at least one specific orientation for the purposes of measuring a respective surface region. The method includes changing a measurement sequence, in which the surface regions should be measured, multiple times using at least one algorithm. The algorithm respectively ascertains a changed measurement sequence and an assessment variable for the changed measurement sequence within the scope of each change. The method includes selecting one of the measurement sequences based on the ascertained assessment variables. A relative relationship of at least two surface regions is specified as a condition to be observed by each measurement sequence

公开(公告)号：US20240142213A1

公开(公告)日：2024-05-02

申请号：US18496904

申请日：2023-10-29

Applicant: Carl Zeiss Industrielle Messtechnik GmbH

Inventor： Johannes Geiger ,  Tobias Perkhuhn ,  Alwine Schroll ,  Matthias Wahl ,  Sabrina Rau ,  Malte Langmack

IPC: G01B5/012 ,  G01K1/02 ,  G01K15/00

CPC classification number: G01B5/012 ,  G01K1/026 ,  G01K15/007 ,  H05B3/0033

Abstract: A measurement device includes a measurement head configured to capture dimensional measurement data of a measurement object. A guide structure is configured to move and guide at least one of the measurement head and the measurement object in a measurement volume of the measurement device. A measurement unit is configured to capture positional data of the guide structure based on which a pose of the measurement head can be calculated. Multiple temperature sensor units are configured to capture temperature data about the measurement volume. Each temperature sensor unit includes a carrier element, a temperature sensor connected to the carrier element, and a heating element connected to the carrier element. A control system is configured to process the dimensional measurement data and the positional data and, based on the temperature data, correct at least one of the dimensional measurement data and the positional data.

公开(公告)号：US20240003674A1

公开(公告)日：2024-01-04

申请号：US18216552

申请日：2023-06-29

Applicant: Carl Zeiss Industrielle Messtechnik GmbH

Inventor： Aksel Göhnermeier

IPC: G01B11/00 ,  G02B26/08 ,  G02B13/22 ,  H04N23/56 ,  H04N23/12

CPC classification number: G01B11/005 ,  G02B26/0833 ,  G02B13/22 ,  H04N23/56 ,  H04N23/12

Abstract: A photogrammetric camera for the two-dimensional measurement of objects has a lens, an image sensor and a pupil filter configured as a micromirror, each of which is transferable into a first and second tilted position. An illumination system produces light. A micromirror in the first tilt position reflects light produced by the illumination system such that the light cannot reach the object while light reflected at the object is guided to the image sensor. Conversely, a micromirror in the second tilt position reflects light such that the light can reach the object while light reflected at the object is supplied to the image sensor. To implement a recording of an image with coaxial dark or coaxial reflected light illumination, the micromirror device is controlled such that the light produced by the illumination system is incident on the surface at different angles within an angular range of at least arcsin(NA).

公开(公告)号：US11774228B2

公开(公告)日：2023-10-03

申请号：US17119854

申请日：2020-12-11

Applicant: Carl Zeiss Industrielle Messtechnik GmbH

Inventor： Günter Haas ,  Florian Dotschkal ,  Tobias Schramm

IPC: G01B5/016 ,  G01B11/00

CPC classification number: G01B5/016 ,  G01B11/005

Abstract: A method is described for measuring workpieces, each having structural features that form test features for measurement. The method determines an unstable one and a stable one of the test features, based on expected violation or satisfaction, respectively, of a statistical control rule. The method measures workpieces such that the unstable test feature is measured more frequently than the stable test feature. The method ascertains whether the unstable test feature remains unstable and whether the stable test feature remains stable. The method measures additional workpieces if the unstable test feature remained unstable and the stable test feature remaining stable. The determining is repeated if the unstable test feature is no longer unstable, the stable test feature is no longer stable, or any other measurement feature changes, such as if a new batch of workpieces is to be measured, environmental conditions change, or measurement has proceeded longer than a predefined threshold.

公开(公告)号：US11713965B2

公开(公告)日：2023-08-01

申请号：US16870971

申请日：2020-05-10

Applicant: Carl Zeiss Industrielle Messtechnik GmbH

Inventor： Heinrich Mueller ,  Konrad Werner

IPC: G01B21/22 ,  G01B21/02 ,  G06F30/10

CPC classification number: G01B21/22 ,  G01B21/02 ,  G06F30/10

Abstract: An apparatus, a method, and a computer program for determining a chamfer property of a workpiece chamfer are provided. The method includes generating measurement points along at least a first measuring path, the first measuring path running over a first chamfer edge, determining at least one unadapted compensating element for the measurement points of the first measuring path, and determining a spatial position of the first chamfer edge depending on a deviation between the measurement points of the first measuring path and the at least one unadapted compensating element.

公开(公告)号：US11675080B2

公开(公告)日：2023-06-13

申请号：US16249881

申请日：2019-01-16

Applicant: Carl Zeiss Industrielle Messtechnik GmbH

Inventor： Wolfgang Hoegele ,  Volker Rasenberger ,  Florian Rettich ,  Thomas Mayer

IPC: G01S17/42 ,  G01S7/481 ,  G01S17/875 ,  G01S7/48 ,  G01S17/66

CPC classification number: G01S17/42 ,  G01S7/4804 ,  G01S7/4818 ,  G01S17/875 ,  G01S17/66

Abstract: An apparatus for determining at least one spatial position and orientation of at least one object with at least three retroreflectors is provided. The apparatus has at least one LIDAR unit with at least three measurement channels. The LIDAR unit has at least one illumination device, which is configured to produce at least one frequency modulated input light beam. The LIDAR unit has at least one first beam splitter, wherein the first beam splitter is configured to divide the input light beam among the measurement channels in parallel and/or in sequence. The measurement channels are each configured to produce at least one measurement signal. The LIDAR unit is configured to produce at least one LIDAR signal for the measurement signals. The apparatus has at least one evaluation unit, which is configured to determine the spatial position and orientation of the object from the LIDAR signal.

公开(公告)号：US20230166457A1

公开(公告)日：2023-06-01

申请号：US18162456

申请日：2023-01-31

Applicant: Carl Zeiss Industrielle Messtechnik GmbH

Inventor： Bernhard WIEDEMANN ,  Dominik SCHMID ,  Marius HAEUSELE ,  Heiko DEGEN

IPC: B29C64/393 ,  B29C64/245 ,  B33Y50/02 ,  B33Y10/00 ,  B33Y30/00

CPC classification number: B29C64/393 ,  B29C64/245 ,  B33Y50/02 ,  B33Y10/00 ,  B33Y30/00

Abstract: A method for additively manufacturing a workpiece having lateral workpiece dimensions includes obtaining a first data set defining the workpiece in layers arranged on top of the other. The method includes providing a manufacturing platform having lateral platform dimensions that are greater than the lateral workpiece dimensions. The method includes providing a structuring tool movable relative to the manufacturing platform. The method includes selecting an individual manufacturing region on the manufacturing platform. The method includes obtaining a second data set that represents individual layer deformations that are dependent on the selected manufacturing region. The method includes producing a defined material layer of the workpiece in the manufacturing region by controlling the structuring tool using the first and second data sets. The method includes repeating the producing in order to produce further defined material layers one on top of the other using the first data set and the second data set.