- 专利标题: Probe unit and measuring system
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申请号: US16690613申请日: 2019-11-21
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公开(公告)号: US11047678B2公开(公告)日: 2021-06-29
- 发明人: Satoshi Koga , Akinori Saito , Hiroyuki Kanamori
- 申请人: MITUTOYO CORPORATION
- 申请人地址: JP Kanagawa
- 专利权人: MITUTOYO CORPORATION
- 当前专利权人: MITUTOYO CORPORATION
- 当前专利权人地址: JP Kanagawa
- 代理机构: Greenblum & Bernstein, P.L.C.
- 优先权: JPJP2018-222917 20181128
- 主分类号: G01B5/008
- IPC分类号: G01B5/008 ; G01B21/04 ; G01B3/20 ; G01B5/012
摘要:
In a probe unit having a measuring probe, a signal processing circuit includes: a signal synthesizing portion configured to process an output of a detection element to output a composite signal obtained by synthesizing displacement components of a contact part in three directions perpendicular to one another; and a signal outputting portion configured to output a digital touch signal to the outside of the probe unit when the composite signal satisfies a predetermined threshold condition. The signal outputting portion includes three comparing portions each configured to compare a threshold condition with the composite signal. When the measuring probe measures the object to be measured, the signal outputting portion outputs the digital touch signal corresponding to outputs of the first and second comparing portions. Thus, there can be provided a probe unit and a measuring system that can stably make measurements with high accuracy while keeping high noise resistance.
公开/授权文献
- US20200166336A1 PROBE UNIT AND MEASURING SYSTEM 公开/授权日:2020-05-28
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