Defect judging unit of measuring probe and defect judging method thereof

    公开(公告)号:US11268874B2

    公开(公告)日:2022-03-08

    申请号:US16892708

    申请日:2020-06-04

    摘要: Provided is a defect judging unit for a measuring probe including: a stylus; four detection elements; and a signal processing part. The defect judging unit includes a defect judging part configured to compare four judged signals corresponding to the generated signals with predetermined thresholds when the object to be measured and the contact part are out of contact with each other and judge that a defect exists if any of the judged signals is greater than the predetermined threshold, and a judged result output part configured to output a judged result of the defect judging part. According to this configuration, the defect judging unit of the measuring probe and the defect judging method thereof capable of ensuring measurement reliability with a simple configuration are provided.

    COORDINATE MEASUREMENT PROBE BODY
    2.
    发明申请

    公开(公告)号:US20190120606A1

    公开(公告)日:2019-04-25

    申请号:US16094836

    申请日:2017-04-18

    IPC分类号: G01B7/012

    摘要: A coordinate measuring probe body includes a rigid probe body structure including an upper mounting portion, a compliant element mounting frame, and an axial extension portion between them. A stylus suspension portion includes compliant elements that suspend a moving element from the compliant element mounting frame. A displacement sensing arrangement that senses displacement of the moving element includes displacement sensors that output a respective displacement signals. A circuit board assembly that receives the displacement signals has three component mounting portions which are interconnected with a flexible circuit component, and located around the axial extension portion. In various embodiments, all of the compliant elements are located on a distal side of the circuit board assembly.

    Coordinate measurement probe body

    公开(公告)号:US10852119B2

    公开(公告)日:2020-12-01

    申请号:US16094836

    申请日:2017-04-18

    摘要: A coordinate measuring probe body includes a rigid probe body structure including an upper mounting portion, a compliant element mounting frame, and an axial extension portion between them. A stylus suspension portion includes compliant elements that suspend a moving element from the compliant element mounting frame. A displacement sensing arrangement that senses displacement of the moving element includes displacement sensors that output a respective displacement signals. A circuit board assembly that receives the displacement signals has three component mounting portions which are interconnected with a flexible circuit component, and located around the axial extension portion. In various embodiments, all of the compliant elements are located on a distal side of the circuit board assembly.

    Probe unit and measuring system
    4.
    发明授权

    公开(公告)号:US11047678B2

    公开(公告)日:2021-06-29

    申请号:US16690613

    申请日:2019-11-21

    摘要: In a probe unit having a measuring probe, a signal processing circuit includes: a signal synthesizing portion configured to process an output of a detection element to output a composite signal obtained by synthesizing displacement components of a contact part in three directions perpendicular to one another; and a signal outputting portion configured to output a digital touch signal to the outside of the probe unit when the composite signal satisfies a predetermined threshold condition. The signal outputting portion includes three comparing portions each configured to compare a threshold condition with the composite signal. When the measuring probe measures the object to be measured, the signal outputting portion outputs the digital touch signal corresponding to outputs of the first and second comparing portions. Thus, there can be provided a probe unit and a measuring system that can stably make measurements with high accuracy while keeping high noise resistance.

    Measuring probe
    5.
    发明授权

    公开(公告)号:US10415949B2

    公开(公告)日:2019-09-17

    申请号:US15440280

    申请日:2017-02-23

    IPC分类号: G01B7/012 G01B7/00

    摘要: A measuring probe includes two supporting members, each having a rotationally symmetric shape and allowing for an attitude change of a stylus, in an axial direction of a probe housing. Four detection elements are disposed at fourfold symmetric positions in one of the two supporting members that includes four deformable arm parts. A signal processing circuit includes a first processing part that processes outputs of the detection elements to output three displacement signals representing displacement components of a contact part in mutually perpendicular three directions, respectively. The measuring probe capable of reducing measurement directional dependency of sensitivity with a simple configuration while maintaining high sensitivity is thus provided.

    Measuring probe
    6.
    发明授权

    公开(公告)号:US10393495B2

    公开(公告)日:2019-08-27

    申请号:US15440440

    申请日:2017-02-23

    摘要: A measuring probe includes: a stylus having a contact part to be brought into contact with an object to be measured; a probe housing capable of supporting the stylus on an axial center; and a detection element capable of detecting a movement of the contact part. The measuring probe further includes: two supporting members disposed in an axial direction of the probe housing, the supporting member allowing for an attitude change of the stylus; and a coupling shaft for coupling the two supporting members together. The detection element is disposed in one of the two supporting members that is farthest away from a rotational center position of rotation generated in the stylus when a measuring force is applied to the contact part from a direction perpendicular to the axial direction, to detect a strain amount of the one of the two supporting members.