- 专利标题: Structured light depth imaging under various lighting conditions
-
申请号: US16108472申请日: 2018-08-22
-
公开(公告)号: US11048957B2公开(公告)日: 2021-06-29
- 发明人: Vikram VijayanBabu Appia
- 申请人: Texas Instruments Incorporated
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 Ebby Abraham; Charles A. Brill; Frank D. Cimino
- 主分类号: G06K9/20
- IPC分类号: G06K9/20 ; G01C11/02 ; G06K9/00 ; G06K9/50 ; G06T7/521 ; G06T7/11 ; G06T7/136
摘要:
A method of image processing in a structured light imaging system is provided that includes receiving a captured image of a scene, wherein the captured image is captured by a camera of a projector-camera pair, and wherein the captured image includes a binary pattern projected into the scene by the projector, applying a filter to the rectified captured image to generate a local threshold image, wherein the local threshold image includes a local threshold value for each pixel in the rectified captured image, and extracting a binary image from the rectified captured image wherein a value of each location in the binary image is determined based on a comparison of a value of a pixel in a corresponding location in the rectified captured image to a local threshold value in a corresponding location in the local threshold image.
公开/授权文献
信息查询