- 专利标题: System and method for estimating and compensating for sample drift during data acquisition in fluorescence microscopy
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申请号: US16347673申请日: 2017-11-17
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公开(公告)号: US11067510B2公开(公告)日: 2021-07-20
- 发明人: Hongqiang Ma , Yang Liu
- 申请人: UNIVERSITY OF PITTSBURGH—OF THE COMMONWEALTH SYSTEM OF HIGHER EDUCATION
- 申请人地址: US PA Pittsburgh
- 专利权人: UNIVERSITY OF PITTSBURGH—OF THE COMMONWEALTH SYSTEM OF HIGHER EDUCATION
- 当前专利权人: UNIVERSITY OF PITTSBURGH—OF THE COMMONWEALTH SYSTEM OF HIGHER EDUCATION
- 当前专利权人地址: US PA Pittsburgh
- 代理机构: Eckert Seamans Cherin & Mellot, LLC
- 代理商 Philip E. Levy
- 国际申请: PCT/US2017/062125 WO 20171117
- 国际公布: WO2018/102147 WO 20180607
- 主分类号: G01N21/64
- IPC分类号: G01N21/64 ; G01N21/27 ; G01N21/01 ; G02B21/00 ; G02B21/36 ; G02B21/16
摘要:
A method of estimating relative change of the 3D position of an object (e.g., sample drift in a microscopy system) having fiduciary markers that have an asymmetric joint point spread function distribution includes generating a plurality of calibration curves for each of the markers during a calibration phase including first calibration curves for a PSF width and second calibration curves for lateral bias. The method further includes capturing a first image of the markers during a data acquisition phase, generating a first joint 3D position for the markers using the first image, the first calibration curves and the second calibration curves, capturing a second image of the markers during the data acquisition phase, generating a second joint 3D position for the markers using the second image and the first and second calibration curves, and estimating the sample drift using the first joint 3D position and the second joint 3D position.
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