- 专利标题: Beam scanning apparatus and optical apparatus including the same
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申请号: US16277071申请日: 2019-02-15
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公开(公告)号: US11085996B2公开(公告)日: 2021-08-10
- 发明人: Junghyun Park , Jungwoo Kim , Byunggil Jeong , Changgyun Shin , Byounglyong Choi
- 申请人: SAMSUNG ELECTRONICS CO., LTD.
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 代理机构: Sughrue Mion, PLLC
- 优先权: KR10-2018-0070421 20180619
- 主分类号: G02F1/19
- IPC分类号: G02F1/19 ; G02F1/07 ; G01S7/481 ; G02F1/01 ; G01S17/89 ; G01S17/90
摘要:
A beam scanning apparatus includes a light source configured to emit light, and a reflective phased array device configured to reflect the light emitted from the light source and incident on the reflective phased array device, and electrically adjust a reflection angle of the reflected light reflected by the reflective phased array device, wherein the light source and the reflective phased array device are disposed such the light is incident on the reflective phased array device at an incidence angle with respect to a normal of a reflective surface of the reflective phased array device.