An array of CMUT cells (10) has a DC bias voltage (VB) coupled to the top electrodes of the cells to bias the electrode to a desired collapsed or partially collapsed state. Fuses (200) are coupled in series with the bottom electrodes (22) of the cells which will open and isolate an individual cell from the other still-functional cells of the array in the event of a failure of the individual cell. In a preferred embodiment the cells are coupled to control integrated circuitry such as microbeamformer circuitry and the fuses are formed of semiconductor materials with the integrated circuitry, thereby leaving the MUT surface area available for high density MUT fabrication. Damage to the integrated circuitry due to short-circuiting of the DC bias current through a failed cell is prevented.