Invention Grant
- Patent Title: Annular-irradiation high-resolution quantitative phase microimaging method using an annular illumination aperture
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Application No.: US16496548Application Date: 2018-02-26
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Publication No.: US11106029B2Publication Date: 2021-08-31
- Inventor: Qian Chen , Chao Zuo , Jiasong Sun , Shijie Feng , Yuzhen Zhang , Guohua Gu
- Applicant: NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Applicant Address: CN Jiangsu
- Assignee: NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Current Assignee: NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Current Assignee Address: CN Jiangsu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: CN201710182694.9 20170324
- International Application: PCT/CN2018/077214 WO 20180226
- International Announcement: WO2018/171383 WO 20180927
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G02B21/36 ; G02B21/06 ; G06T5/10 ; G06T5/50

Abstract:
An annular-irradiation high-resolution quantitative phase microimaging based on light intensity transfer equation is proposed here includes designing an annular aperture for the imaging system illumination; invoking the weak object approximation by using the parameters of annular illumination aperture and bright field microscopy to calculate a weak object optical transfer function (WOTF) on the basis of a partially coherent imaging theory; and collecting three intensity images by a camera and obtaining the quantitative phase image of object by resolving the light intensity transfer equation with a deconvolution algorithm.
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