Invention Grant
- Patent Title: Method and apparatus for measuring downlink interference in OFDM mobile communication system
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Application No.: US16017496Application Date: 2018-06-25
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Publication No.: US11109385B2Publication Date: 2021-08-31
- Inventor: Younsun Kim , Kiil Kim , Hyojin Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: The Farrell Law Firm, P.C.
- Priority: KR10-2011-0061454 20110624
- Main IPC: H04W72/08
- IPC: H04W72/08 ; H04B17/318 ; H04B17/336 ; H04J11/00 ; H04B17/24 ; H04B17/345 ; H04W88/08 ; H04L5/00 ; H04B7/022

Abstract:
A method of a base station in a wireless communication system, a method of a terminal, a base station, and a terminal are provided. The method of the base station includes transmitting configuration information on measuring a channel state, wherein the configuration information includes first information on a first resource for a channel measurement and second information on a second resource for an interference measurement; transmitting a channel state information reference signal (CSI-RS) associated with the first resource; and receiving channel state information based on the first resource and the second resource, and wherein the second resource is a resource for muting data transmission, and wherein the second resource is one of resources for muting data transmission which are configured to a user equipment (UE).
Public/Granted literature
- US20180310318A1 METHOD AND APPARATUS FOR MEASURING DOWNLINK INTERFERENCE IN OFDM MOBILE COMMUNICATION SYSTEM Public/Granted day:2018-10-25
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