Invention Grant
- Patent Title: Variable resistance memory devices, and methods of forming variable resistance memory devices
-
Application No.: US16824927Application Date: 2020-03-20
-
Publication No.: US11127900B2Publication Date: 2021-09-21
- Inventor: Shin-Jae Kang , Gyuhwan Oh , Jiyoon Chung , Junyeon Hwang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Myers Bigel, P.A.
- Priority: KR10-2017-0082399 20170629
- Main IPC: H01L27/24
- IPC: H01L27/24 ; H01L45/00

Abstract:
Variable resistance memory devices are provided. A variable resistance memory device includes conductive lines and a memory cell including a variable resistance element on one of the conductive lines. The variable resistance memory device includes a first insulating region between the conductive lines. Moreover, the variable resistance memory device includes a second insulating region on the first insulating region between the conductive lines. Methods of forming variable resistance memory devices are also provided.
Public/Granted literature
- US20200220077A1 VARIABLE RESISTANCE MEMORY DEVICES, AND METHODS OF FORMING VARIABLE RESISTANCE MEMORY DEVICES Public/Granted day:2020-07-09
Information query
IPC分类: