- 专利标题: Variable resistance memory devices, and methods of forming variable resistance memory devices
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申请号: US16824927申请日: 2020-03-20
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公开(公告)号: US11127900B2公开(公告)日: 2021-09-21
- 发明人: Shin-Jae Kang , Gyuhwan Oh , Jiyoon Chung , Junyeon Hwang
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 代理机构: Myers Bigel, P.A.
- 优先权: KR10-2017-0082399 20170629
- 主分类号: H01L27/24
- IPC分类号: H01L27/24 ; H01L45/00
摘要:
Variable resistance memory devices are provided. A variable resistance memory device includes conductive lines and a memory cell including a variable resistance element on one of the conductive lines. The variable resistance memory device includes a first insulating region between the conductive lines. Moreover, the variable resistance memory device includes a second insulating region on the first insulating region between the conductive lines. Methods of forming variable resistance memory devices are also provided.
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