Invention Grant
- Patent Title: Automated handling of different form factor devices under test in test cell
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Application No.: US15581361Application Date: 2017-04-28
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Publication No.: US11143697B2Publication Date: 2021-10-12
- Inventor: Roland Wolff
- Applicant: Advantest Corporation
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: G01R31/28
- IPC: G01R31/28 ; B25J9/16

Abstract:
A system for performing tests using automated test equipment (ATE) is disclosed. The system comprises a robot comprising an end effector operable to pick up and transfer a DUT in-and-out of a test slot in a primitive. The system further comprises a system controller comprising a memory and a processor for controlling the robot. Also, the system comprises a test rack comprising a plurality of primitives, wherein the primitive is a modular device comprising a plurality of slots for testing a plurality of DUTs, and wherein the robot is configured to access slots in the plurality of primitives within the test rack using the end effector.
Public/Granted literature
- US20180313890A1 AUTOMATED HANDLING OF DIFFERENT FORM FACTOR DEVICES UNDER TEST IN TEST CELL Public/Granted day:2018-11-01
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