A device fault processing method is used to perform fault processing on a peripheral component interconnect express device. The method includes: obtaining, by the controller, first device fault information after detecting that the device is faulty, where the first device fault information is used to indicate that the device is faulty, the first device fault information includes a first value of a fault processing state parameter of the device, and the first value indicates that the device is in a soft reset state; and performing, by the controller, hot reset processing on the device, so as to implement fault processing on the peripheral component interconnect express device without manual intervention in plugging out and plugging in or resetting a pluggable unit in which the peripheral component interconnect express device is located and without manual resetting on a computer system.