Invention Grant
- Patent Title: Measuring method and laser scanner
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Application No.: US15667668Application Date: 2017-08-03
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Publication No.: US11150346B2Publication Date: 2021-10-19
- Inventor: Fumio Ohtomo , Kaoru Kumagai , Tetsuji Anai
- Applicant: TOPCON Corporation
- Applicant Address: JP Tokyo-to
- Assignee: TOPCON Corporation
- Current Assignee: TOPCON Corporation
- Current Assignee Address: JP Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JPJP2016-160048 20160817
- Main IPC: G01S17/08
- IPC: G01S17/08 ; G01B11/14 ; G01C15/00

Abstract:
A measuring method, wherein point cloud data of a building is acquired by a laser scanner, wherein the laser scanner has an attitude detector for detecting a tilting with respect to a horizontality or a verticality, converts the point cloud data into a horizontal distance and a height or a difference of a height based on the tilting detected by the attitude detector, sets a height line at a predetermined height on a wall surface, averages a horizontal distance information of the point cloud data included in a predetermined width with the height line as a center in a height direction, further develops the horizontal distance information along the height line in a horizontal direction, and measures a horizontal cross section at the predetermined height.
Public/Granted literature
- US20180052232A1 Measuring Method And Laser Scanner Public/Granted day:2018-02-22
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