Invention Grant
- Patent Title: Automatic detecting method and automatic detecting apparatus using the same
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Application No.: US16429772Application Date: 2019-06-03
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Publication No.: US11151724B2Publication Date: 2021-10-19
- Inventor: Tzu-Ping Kao , Ching-Hsing Hsieh , Chia-Chi Chang , Ju-Te Chen , Chen-Hui Huang , Cheng-Hsien Chen
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsinchu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, PC
- Main IPC: G06T7/13
- IPC: G06T7/13 ; G06T7/00 ; G06T7/60

Abstract:
An automatic detecting method and an automatic detecting apparatus using the same are provided. The automatic detecting apparatus includes an inputting unit, a dividing unit, a contouring unit, a range analyzing unit, a boundary analyzing unit, an edge detecting unit, an expanding unit and an overlapping unit. The dividing unit is used for dividing an overlooking image into four clusters via a clustering algorithm. The contouring unit is used for obtaining a contour. The range analyzing unit is used for obtaining a detecting range. The boundary analyzing unit is used for obtaining a circular boundary in the detecting range. The edge detecting unit is used for obtaining a plurality of edges in the circular boundary. The expanding unit is used for expanding the edges to obtain a plurality of expanded edges. The overlapping unit is used for overlapping the expanded edges and the contour to obtain a defect pattern.
Public/Granted literature
- US20200380693A1 AUTOMATIC DETECTING METHOD AND AUTOMATIC DETECTING APPARATUS USING THE SAME Public/Granted day:2020-12-03
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