Invention Grant
- Patent Title: Method for analyzing samples and device for analyzing samples
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Application No.: US16340055Application Date: 2017-10-04
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Publication No.: US11169071B2Publication Date: 2021-11-09
- Inventor: Hirotoshi Yasaki , Takao Yasui , Noritada Kaji , Yoshinobu Baba , Tomoji Kawai , Satoyuki Kawano , Kentaro Doi , Takeshi Yanagida , Mao Fukuyama
- Applicant: National University Corporation Nagoya University , OSAKA UNIVERSITY , KYUSHU UNIVERSITY, NATIONAL UNIVERSITY CORPORATION
- Applicant Address: JP Aichi; JP Osaka; JP Fukuoka
- Assignee: National University Corporation Nagoya University,OSAKA UNIVERSITY,KYUSHU UNIVERSITY, NATIONAL UNIVERSITY CORPORATION
- Current Assignee: National University Corporation Nagoya University,OSAKA UNIVERSITY,KYUSHU UNIVERSITY, NATIONAL UNIVERSITY CORPORATION
- Current Assignee Address: JP Aichi; JP Osaka; JP Fukuoka
- Agency: McDermott Will & Emery LLP
- Priority: JPJP2016-199331 20161007
- International Application: PCT/JP2017/036124 WO 20171004
- International Announcement: WO2018/066597 WO 20180412
- Main IPC: G01N15/00
- IPC: G01N15/00 ; G01N27/447 ; G01N15/10 ; G01N27/327

Abstract:
In a method for analyzing samples involving the use of a device for analyzing samples, the device for analyzing samples includes at least a movement part through which a sample moves, and a measurement unit that is formed in a middle of the movement part and that measures a value of an ion current when the sample passes through the movement part. The analysis method includes at least a measurement step for measuring the value of the ion current when the sample passes through the movement part, and a determination step for determining a change over time in a quantity of ions from the value of the ion current measured in the measurement step. The quantity of ions includes a quantity of ions that have leaked from the sample during movement of the sample through the movement part.
Public/Granted literature
- US20200033248A1 METHOD FOR ANALYZING SAMPLES AND DEVICE FOR ANALYZING SAMPLES Public/Granted day:2020-01-30
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