Invention Grant
- Patent Title: Dram array architecture with row hammer stress mitigation
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Application No.: US17114404Application Date: 2020-12-07
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Publication No.: US11176987B2Publication Date: 2021-11-16
- Inventor: Christopher J. Kawamura , Charles L. Ingalls , Tae H. Kim
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: G11C8/00
- IPC: G11C8/00 ; G11C11/408 ; G11C11/4076

Abstract:
An apparatus includes a plurality of main word line circuits. Each main word line circuit drives a respective global word line to one of an active state value, an intermediate voltage state, or a pre-charge state. The intermediate voltage state voltage is below the active state voltage and above the pre-charge state voltage. The memory device also includes a plurality of sub-word line drivers. Each sub-word line driver is connected to a corresponding global word line and configured to drive a respective local word line between the corresponding global word line voltage and a low voltage value. The apparatus further includes a plurality of phase drivers. Each phase driver is connected to a predetermined number of sub-word line drivers, where each of the predetermined number of sub-word line drivers connects to a different global word line.
Public/Granted literature
- US20210090636A1 DRAM ARRAY ARCHITECTURE WITH ROW HAMMER STRESS MITIGATION Public/Granted day:2021-03-25
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