Invention Grant
- Patent Title: Package including metallic bolstering pattern and manufacturing method of the package
-
Application No.: US16824722Application Date: 2020-03-20
-
Publication No.: US11177218B2Publication Date: 2021-11-16
- Inventor: Jiun-Yi Wu , Chien-Hsun Lee , Shou-Yi Wang , Chien-Hsun Chen
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H01L25/065
- IPC: H01L25/065 ; H01L23/538 ; H01L23/31 ; H01L21/52 ; H01L23/00 ; H01L21/56

Abstract:
A package has a first semiconductor die, a second semiconductor die, a redistribution structure and a metallic bolstering pattern. The second semiconductor die is disposed beside the first semiconductor die and spaced apart from the first semiconductor die with a distance. The redistribution structure is disposed over the first semiconductor die and the second semiconductor die and is electrically connected with the first and second semiconductor dies. The metallic bolstering pattern is disposed between the redistribution structure and the first and second semiconductor dies. The metallic bolstering pattern is disposed on the redistribution structure and located over the first and second semiconductor dies, and the metallic bolstering pattern extends across the distance between the first and second semiconductor dies and extends beyond borders of the first and second semiconductor dies.
Public/Granted literature
- US20210296243A1 PACKAGE INCLUDING METALLIC BOLSTERING PATTERN AND MANUFACTURING METHOD OF THE PACKAGE Public/Granted day:2021-09-23
Information query
IPC分类: