Invention Grant
- Patent Title: Measurement method and apparatus
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Application No.: US16832236Application Date: 2020-03-27
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Publication No.: US11178588B2Publication Date: 2021-11-16
- Inventor: Hongping Zhang , Qinghai Zeng
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Slater Matsil, LLP
- Priority: CN201710900295.1 20170928
- Main IPC: H04W36/00
- IPC: H04W36/00 ; H04B17/318 ; H04W76/15 ; H04L5/00 ; H04W24/10 ; H04W36/30

Abstract:
This application provides a measurement method and an apparatus. The method includes: receiving a measurement configuration from a base station, where the measurement configuration includes indication information, and the indication information is used to indicate a relationship between neighboring cell measurement of a terminal and configured s-measure of the terminal. In the method, the indication information may be carried in the measurement configuration, and the indication information indicates the relationship between the neighboring cell measurement of the terminal and configured s-measure of the terminal.
Public/Granted literature
- US20200229052A1 MEASUREMENT METHOD AND APPARATUS Public/Granted day:2020-07-16
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