Invention Grant
- Patent Title: Calibration verification for optical particle analyzers
-
Application No.: US16678968Application Date: 2019-11-08
-
Publication No.: US11181455B2Publication Date: 2021-11-23
- Inventor: Thomas A. Bates , Matt Michaelis , Brett Haley
- Applicant: Particle Measuring Systems, Inc.
- Applicant Address: US CO Boulder
- Assignee: Particle Measuring Systems, Inc.
- Current Assignee: Particle Measuring Systems, Inc.
- Current Assignee Address: US CO Boulder
- Agency: Leydig, Voit & Mayer, Ltd.
- Main IPC: G01N15/02
- IPC: G01N15/02 ; G01N15/06 ; H01S3/00

Abstract:
Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer. The method includes the steps of providing an optical particle analyzer and modulating a power applied to a source of EMR. The method includes the steps of, in response to the modulating step, inducing a detector signal waveform and analyzing the detector signal waveform to determine a value of at least one diagnostic parameter associated with one or more of the source of EMR, an optical assembly, a chamber, a detector, and an optical collection system of the optical particle analyzer. The method includes the step of determining a calibration status of the optical particle analyzer based on the one or more determined values of the at least one diagnostic parameter.
Public/Granted literature
- US20200150017A1 CALIBRATION VERIFICATION FOR OPTICAL PARTICLE ANALYZERS Public/Granted day:2020-05-14
Information query