ENHANCED DUAL-PASS AND MULTI-PASS PARTICLE DETECTION

    公开(公告)号:US20230236107A1

    公开(公告)日:2023-07-27

    申请号:US18156583

    申请日:2023-01-19

    Abstract: A particle detection system may include a light source, a first beam splitter, a particle interrogation zone, a reflecting surface, a second beam splitter, a first photodetector, and a second photodetector. The first beam splitter may be configured to split the source beam into an interrogation beam and a reference beam. The particle interrogation zone may be disposed in the path of the interrogation beam. The reflecting surface may be configured to reflect the interrogation beam back on itself. The second beam splitter may be configured to: (i) receive the reference beam and side scattered light from one or more particles interacting with the interrogation beam in the particle interrogation zone; and (ii) produce a first component beam and second component beam. The first photodetector may be configured to detect the first component beam. The second photodetector may be configured to detect the second component beam.

    CALIBRATION VERIFICATION FOR OPTICAL PARTICLE ANALYZERS

    公开(公告)号:US20210404936A1

    公开(公告)日:2021-12-30

    申请号:US17290494

    申请日:2020-04-27

    Abstract: Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer, including independently of the presence or absence of particles. The method and analyzers include use of distinct and non-interfering time frequency domains: a middle frequency time domain and a low frequency time domain, and optionally a high frequency time domain. The high frequency time domain generates a laser facet drive current frequency modulation to prevent the laser facet from spatial-mode hopping. The middle frequency time domain is for particle detection. The low frequency time domain is for calibration status, including laser-pulse-light self-diagnostics, for the health or calibration status of the analyzer. By carefully selecting the frequency time domain ranges, there is non-interference, with the ability to self-diagnose the instrument that is particle-independent.

    DETECTING NANOPARTICLES ON PRODUCTION EQUIPMENT AND SURFACES

    公开(公告)号:US20200072724A1

    公开(公告)日:2020-03-05

    申请号:US16559074

    申请日:2019-09-03

    Abstract: Provided herein is a particle analyzer that is operably connected to a probe unit that is capable of both dislodging particles from a surface and sampling the particles after they have been dislodged. The devices and methods described herein may be lightweight and/or handheld, for example, so that they may be used within a cleanroom environment to clean and sample permanent surfaces and tools. The devices may include optical particle counters that use scattered, obscured or emitted light to detect particles, including condensation particle counting systems or split detection optical particle counters to increase the sensitivity of the device and thereby facilitate detection of smaller particles, while avoiding the increased complexity typically required for the detection of nanoscale particles, such as particles less than 100 nm in effective diameter.

    Laser noise detection and mitigation in particle counting instruments

    公开(公告)号:US09989462B2

    公开(公告)日:2018-06-05

    申请号:US15088679

    申请日:2016-04-01

    Abstract: This invention relates to optical particle counters and methods capable of effectively distinguishing signals generated from particle light scattering from sources of noise. Embodiments of the invention, for example, use multisensory detector configurations for identifying and distinguishing signals corresponding to fluctuations in laser intensity from signals corresponding to particle light scattering for the detection and characterization of submicron particles. In an embodiment, for example, methods and systems of the invention compare signals from different detector elements of a detector array to identify and characterize noise events, such as noise generated from laser intensity instability, thereby allow for the detection and characterization of smaller particles. The system and methods of the present invention, thus, provide an effective means of reducing false positives caused by noise or interference while allowing for very sensitive particle detection.

    Particle impactor with selective height adjustment

    公开(公告)号:US09885640B2

    公开(公告)日:2018-02-06

    申请号:US14645753

    申请日:2015-03-12

    Abstract: Provided are impactors for detecting biologics having an adjustable separation distance between an impact surface and the intake aperture, including the exit of the intake aperture. The impactor has a sampling head having at least one intake aperture and an exit, an impactor base comprising an impact surface, wherein the impact surface opposibly faces the sampling head exit and is separated from the exit by a separation distance. The separation distance is continuously adjustable between a minimum separation distance and a maximum separation distance and can accommodate impact surfaces having different heights by positioning the impact surface, irrespective of height of the impact surface, at an optimal separation distance from the sample intake aperture, such as by a rotation-type mechanism with a change in distance indication provided to a user by a separation distance step indicator.

    Method for obtaining aerosol particle size distributions

    公开(公告)号:US09638665B2

    公开(公告)日:2017-05-02

    申请号:US14898934

    申请日:2014-06-17

    Abstract: The invention provides a method for obtaining aerosol particle size distributions with a scanning mobility particle sizer (SMPS) device comprising a differential mobility analyzer (DMA); which method comprises the stages: (i) collecting a first data set of particle concentrations vs. size for a size range from a predetermined minimal size Dmin to an intermediate size Dt by varying a voltage applied to a DMA column of an SMPS from Vmin to Vt1 at a first sheath flow rate Qsh1; (ii) changing the sheath flow rate from the first sheath flow rate Qsh1 to a second sheath flow rate Qsh2; (iii) collecting a second data set of particle concentrations vs. size for a size range from the intermediate size Dt to a predetermined maximum size Dmax by varying the voltage applied to the DMA column of the SMPS from Vt2 to Vmax at the second sheath flow rate Qsh2; (iv) convolving the first data set from stage (i) using an apparatus function of the DMA and the sheath flow rates Qsh1 and Qsh2 in stage (ii); (v) combining the convolved data set from stage (iv) with the second data set from stage (iii) to form a merged data set corresponding to the size distribution from Dmin to Dmax; and (vi) deconvolving the merged data set to provide a size distribution for the full size range Dmin to Dmax. Also provided are a DMA, SMPS or Fast Mobility Particle Sizer (FMPS) apparatus set up to perform the method.

Patent Agency Ranking