Invention Grant
- Patent Title: Multi-gate semiconductor device
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Application No.: US16681097Application Date: 2019-11-12
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Publication No.: US11183560B2Publication Date: 2021-11-23
- Inventor: Chao-Ching Cheng , I-Sheng Chen , Tzu-Chiang Chen , Shih-Syuan Huang , Hung-Li Chiang
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L31/113 ; H01L29/06 ; H01L29/78 ; H01L29/66 ; H01L21/02 ; H01L21/8238 ; H01L27/088 ; H01L27/092 ; H01L29/423 ; H01L21/8234

Abstract:
Semiconductor structures and method for forming the same are provided. The semiconductor structure includes a substrate and first nanostructures and second nanostructures formed over the substrate. The semiconductor structure further includes a first source/drain structure formed adjacent to the first nanostructures and a second source/drain structure formed adjacent to the second nanostructures. The semiconductor structure further includes a first contact plug formed over the first source/drain structure and a second contact plug formed over the second source/drain structure. In addition, a bottom portion of the first contact plug is lower than a bottom portion of the first nanostructures, and a bottom portion of the second contact plug is higher than a top portion of the second nanostructures.
Public/Granted literature
- US20200083327A1 MULTI-GATE SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME Public/Granted day:2020-03-12
Information query
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