- 专利标题: Metrics store system
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申请号: US15339912申请日: 2016-10-31
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公开(公告)号: US11188550B2公开(公告)日: 2021-11-30
- 发明人: Thomas Allan Haggie , Clint Sharp , Alexander Douglas James , David Ryan Marquardt , Hailun Yan , Christopher Pride , Vishal Patel , Amrittpal Singh Bath , Pratiksha Shah , Murugan Kandaswamy , Steve Yu Zhang , Ledion Bitincka , David E. Simmen , Marc Andre Chene , Esguerra Ma Kharisma , Igor Stojanovski
- 申请人: Splunk Inc.
- 申请人地址: US CA San Francisco
- 专利权人: Splunk Inc.
- 当前专利权人: Splunk Inc.
- 当前专利权人地址: US CA San Francisco
- 代理机构: Perkins Coie LLP
- 主分类号: G06F16/248
- IPC分类号: G06F16/248 ; G06F16/22 ; G06F16/25 ; G06F16/28 ; G06F16/901 ; G06F16/951 ; G06F16/242 ; G06F16/2455 ; G06F16/2458 ; G06F16/835 ; G06F16/9038 ; G06F16/9535 ; G06F16/903 ; H04L29/08 ; G06F3/0481 ; G06T11/20 ; H04L12/26
摘要:
The disclosed embodiments include a method performed by a data intake and query system. The method includes ingesting each metric including at least one key value and a measured value taken of a computing resource, and storing each metric in an index of a metrics store, where the index defines at least one dimension populated with the at least one key value and a measure populated with the measured value. The method further includes cataloging metadata in a metrics catalog, where the metadata is related to the metrics stored in the metrics store, performing an analysis of metrics data included in the metrics store and/or the metrics catalog to obtain results, and causing display of the results or an indication of the results on a display device.
公开/授权文献
- US20180089290A1 METRICS STORE SYSTEM 公开/授权日:2018-03-29
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