Invention Grant
- Patent Title: Surveying instrument and photogrammetric method
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Application No.: US16707001Application Date: 2019-12-09
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Publication No.: US11193765B2Publication Date: 2021-12-07
- Inventor: Fumio Ohtomo , Kaoru Kumagai , Tetsuji Anai
- Applicant: TOPCON Corporation
- Applicant Address: JP Tokyo-to
- Assignee: TOPCON Corporation
- Current Assignee: TOPCON Corporation
- Current Assignee Address: JP Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JPJP2018-231315 20181211
- Main IPC: G01C11/10
- IPC: G01C11/10 ; G01C11/02

Abstract:
There is provided a surveying instrument including a distance measuring unit configured to measure a distance to an object to be measured, a measuring direction image pickup module which includes the object to be measured and is configured to acquire as observation image, an attitude detector is configured to detect a tilt of the surveying instrument main body and a arithmetic control module, and wherein the arithmetic control module is configured to extract each common corresponding point from a first image acquired at a first installing point and a second image acquired at a second installing point, perform the matching based on the corresponding point, and make a measurement of a positional relationship of the object to be measured with respect to the first installing point and the second installing point based on a matching image.
Public/Granted literature
- US20200182614A1 Surveying Instrument And Photogrammetric Method Public/Granted day:2020-06-11
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