- 专利标题: Testing semiconductor components
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申请号: US16791152申请日: 2020-02-14
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公开(公告)号: US11201065B2公开(公告)日: 2021-12-14
- 发明人: Enis Tuncer , Byron Harry Gibbs
- 申请人: TEXAS INSTRUMENTS INCORPORATED
- 申请人地址: US TX Dallas
- 专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人地址: US TX Dallas
- 代理商 Ronald O. Neerings; Charles A. Brill; Frank D. Cimino
- 主分类号: H01L21/56
- IPC分类号: H01L21/56 ; H01L21/687
摘要:
A method of manufacturing a semiconductor package includes covering a semiconductor die and a plurality of conductive terminals coupled to the semiconductor die in a mold compound, positioning the mold compound between a first pair of electrodes and a second pair of electrodes, and moving a movable electrode of the first pair and a movable electrode of the second pair into a first clamping position. In the first clamping position, each of the first pair of electrodes and the second pair of electrodes electrically couples to a unique subset of the plurality of conductive terminals. The method also includes applying, by the first pair of electrodes, a first voltage to the semiconductor die within the mold compound; and applying, by the second pair of electrodes, a second voltage to the semiconductor die within the mold compound. The second voltage is less than the first voltage.
公开/授权文献
- US20210134610A1 TESTING SEMICONDUCTOR COMPONENTS 公开/授权日:2021-05-06
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