Invention Grant
- Patent Title: Method for classifying light-emitting semiconductor components and image sensor application having an image sensor and a semiconductor element
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Application No.: US15129406Application Date: 2015-03-19
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Publication No.: US11213859B2Publication Date: 2022-01-04
- Inventor: Felix Kimme , Peter Brick
- Applicant: OSRAM OLED GmbH
- Applicant Address: DE Regensburg
- Assignee: OSRAM OLED GmbH
- Current Assignee: OSRAM OLED GmbH
- Current Assignee Address: DE Regensburg
- Agency: Arent Fox LLP
- Priority: DE102014104234.4 20140326
- International Application: PCT/EP2015/055808 WO 20150319
- International Announcement: WO2015/144562 WO 20151001
- Main IPC: H01L33/00
- IPC: H01L33/00 ; B07C5/34 ; H01L31/147 ; H04N5/225

Abstract:
The invention relates to a method for classifying a light-emitting semiconductor component (301) for an image sensor application, wherein the semiconductor component (301) is designed as a light source for an image sensor (302), comprising the following steps: providing the light-emitting semiconductor component (301); determining at least one of the following parameters of the light emitted with an emission spectrum by the light-emitting semiconductor component (301) during operation: R=∫qR(λ)·S(λ)dλ·texp, G=∫qG(λ)·S(λ)dλ·texp, B=∫qB(λ)·S(λ)dλ·texp, wherein qR(λ), qG(λ), and qB(λ) are spectral sensitivities of a red, green, and blue color channel of the image sensor (302), S(λ) is the emission spectrum of the light-emitting semiconductor component (301), texp is an exposure time, and λ designates a wavelength; classifying the light-emitting semiconductor component (301) into a class from a group of classes, which are characterized by different value ranges of at least one parameter that depends on at least one of the parameters R, G, and B. The invention further relates to an image sensor application.
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