- 专利标题: Semiconductor device including a data storage material pattern
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申请号: US16807245申请日: 2020-03-03
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公开(公告)号: US11217748B2公开(公告)日: 2022-01-04
- 发明人: Youngtak Kim , Sangjine Park , Wonjun Lee , Hyeyeong Seo , Jaeuk Shin
- 申请人: SAMSUNG ELECTRONICS CO., LTD.
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 代理机构: F. Chau & Associates, LLC
- 优先权: KR10-2019-0088807 20190723
- 主分类号: H01L45/00
- IPC分类号: H01L45/00
摘要:
A semiconductor device, includes: a first conductive structure on a substrate; a second conductive structure on the first conductive structure; and a first memory cell structure between the first conductive structure and the second conductive structure, wherein the first memory cell structure includes: a switching material pattern on the first conductive structure; a data storage material pattern on the switching material pattern; and an upper conductive pattern on the data storage material pattern, wherein a first width of a lower region of the data storage material pattern is less than a first width of the switching material pattern, and wherein a first width of the upper conductive pattern is less than a width of an upper region of the data storage material pattern.
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