- Patent Title: Methods and apparatus for monitoring a level of a regulated source
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Application No.: US17061602Application Date: 2020-10-02
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Publication No.: US11243234B2Publication Date: 2022-02-08
- Inventor: Sam Tran , Jay M. Towne , P. Karl Scheller
- Applicant: Allegro MicroSystems, LLC
- Applicant Address: US NH Manchester
- Assignee: Allegro MicroSystems, LLC
- Current Assignee: Allegro MicroSystems, LLC
- Current Assignee Address: US NH Manchester
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- Main IPC: G01R19/165
- IPC: G01R19/165 ; G01R31/40 ; G01R31/28 ; G01R33/02 ; G01D5/14

Abstract:
A monitor circuit for monitoring a level of a first and second regulated source may monitor a voltage level of regulated voltages or a current level of regulated currents. In an embodiment, the monitor circuit includes circuitry responsive to a first regulated current and to a second regulated current. A first circuit responsive to the first regulated current and to the second regulated current generates a first error signal indicative of at least one of an overcurrent condition of the first regulated current and an undercurrent condition of the second regulated current. A second circuit responsive to the first regulated current and to the second regulated current generates a second error signal indicative of at least one of an undercurrent condition of the first regulated current and an overcurrent condition of the second regulated current. A method for monitoring the levels of first and second regulated sources is also provided.
Public/Granted literature
- US20210048456A1 Methods And Apparatus For Monitoring A Level Of A Regulated Source Public/Granted day:2021-02-18
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