Invention Grant
- Patent Title: Epitaxial oxide plug for strained transistors
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Application No.: US16640465Application Date: 2017-09-27
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Publication No.: US11251302B2Publication Date: 2022-02-15
- Inventor: Karthik Jambunathan , Biswajeet Guha , Anupama Bowonder , Anand S. Murthy , Tahir Ghani
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- International Application: PCT/US2017/053582 WO 20170927
- International Announcement: WO2019/066788 WO 20190404
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L21/8234 ; H01L27/088 ; H01L27/092 ; H01L29/423

Abstract:
Epitaxial oxide plugs are described for imposing strain on a channel region of a proximate channel region of a transistor. The oxide plugs form epitaxial and coherent contact with one or more source and drain regions adjacent to the strained channel region. The epitaxial oxide plugs can be used to either impart strain to an otherwise unstrained channel region (e.g., for a semiconductor body that is unstrained relative to an underlying buffer layer), or to restore, maintain, or increase strain within a channel region of a previously strained semiconductor body. The epitaxial crystalline oxide plugs have a perovskite crystal structure in some embodiments.
Public/Granted literature
- US20200220014A1 EPITAXIAL OXIDE PLUG FOR STRAINED TRANSISTORS Public/Granted day:2020-07-09
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