Invention Grant
- Patent Title: Apparatus with a calibration mechanism
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Application No.: US17131156Application Date: 2020-12-22
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Publication No.: US11264069B2Publication Date: 2022-03-01
- Inventor: Jason M. Johnson , Jung-Hwa Choi
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: G11C7/10
- IPC: G11C7/10 ; G11C11/4076 ; G11C11/4093 ; G11C7/22 ; G11C11/408

Abstract:
An apparatus includes: a master die; one or more slave dies; a ZQ resister between a first node and a second node coupled to a voltage terminal; a ZQ pad coupled to each of the first node of the ZQ resister, the master die and the one or more slave dies; and a calibration channel electrically coupling the master die and the one or more slave dies, the calibration channel configured to communicate signals between the master die and the one or more slave dies for coordinating access to the ZQ pad across the master die and the one or more slave dies.
Public/Granted literature
- US20210110855A1 APPARATUS WITH A CALIBRATION MECHANISM Public/Granted day:2021-04-15
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