- 专利标题: Semiconductor device and method for manufacturing semiconductor device
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申请号: US16906569申请日: 2020-06-19
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公开(公告)号: US11271020B2公开(公告)日: 2022-03-08
- 发明人: Akihiro Hanada , Masayoshi Fuchi
- 申请人: Japan Display Inc.
- 申请人地址: JP Minato-ku
- 专利权人: Japan Display Inc.
- 当前专利权人: Japan Display Inc.
- 当前专利权人地址: JP Minato-ku
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2016-116131 20160610
- 主分类号: H01L27/12
- IPC分类号: H01L27/12 ; H01L21/02 ; H01L21/768 ; H01L23/522 ; H01L23/532 ; H01L29/786
摘要:
According to one embodiment, a semiconductor device includes an insulating substrate, a first semiconductor layer located above the insulating substrate, a second semiconductor layer located above the insulating substrate, an insulating layer which covers the first semiconductor layer and the second semiconductor layer, and includes a first contact hole reaching the first semiconductor layer and a second contact hole reaching the second semiconductor layer, a barrier layer which covers one of the first semiconductor layer inside the first contact hole and the second semiconductor layer inside the second contact hole, and a first conductive layer which is in contact with the barrier layer.
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