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公开(公告)号:US11855103B2
公开(公告)日:2023-12-26
申请号:US17587671
申请日:2022-01-28
申请人: Japan Display Inc.
发明人: Akihiro Hanada , Masayoshi Fuchi
IPC分类号: H01L27/12 , H01L21/02 , H01L21/768 , H01L23/522 , H01L23/532 , H01L29/786
CPC分类号: H01L27/124 , H01L21/02063 , H01L21/76802 , H01L21/76843 , H01L21/76877 , H01L23/5226 , H01L23/53223 , H01L23/53266 , H01L27/1218 , H01L27/1222 , H01L27/1225 , H01L27/1262 , H01L29/7869 , H01L29/78603 , H01L29/78675
摘要: According to one embodiment, a semiconductor device includes an insulating substrate, a first semiconductor layer located above the insulating substrate, a second semiconductor layer located above the insulating substrate, an insulating layer which covers the first semiconductor layer and the second semiconductor layer, and includes a first contact hole reaching the first semiconductor layer and a second contact hole reaching the second semiconductor layer, a barrier layer which covers one of the first semiconductor layer inside the first contact hole and the second semiconductor layer inside the second contact hole, and a first conductive layer which is in contact with the barrier layer.
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公开(公告)号:US11846860B2
公开(公告)日:2023-12-19
申请号:US18164809
申请日:2023-02-06
申请人: Japan Display Inc.
IPC分类号: G02F1/1362 , G02F1/1368 , H01L29/786 , H10K50/86 , H10K59/131
CPC分类号: G02F1/1368 , G02F1/136209 , G02F1/136277 , G02F1/136286 , H01L29/78633 , H01L29/78672 , H10K50/865 , H10K59/131
摘要: A display device including: a substrate; a first thin film transistor of polysilicon semiconductor, a second thin film transistor of oxide semiconductor; a first light shading film opposing to the polysilicon semiconductor, and a second light shading film opposing to the oxide semiconductor; a first insulating film, a second insulating film which is constituted from plural insulating films, and a third insulating film superposed in this order; a first through hole penetrating the second insulating film and not penetrating the first insulating film and the third insulating film; a second through hole penetrating the first insulating film and the third insulating film; the first light shading film connects with a first conductive component, a part of the first conductive component exists on the third insulating film, through the second through hole.
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公开(公告)号:US10824211B2
公开(公告)日:2020-11-03
申请号:US16131477
申请日:2018-09-14
申请人: Japan Display Inc.
发明人: Akihiro Hanada , Hajime Watakabe , Kazufumi Watabe
IPC分类号: H01L27/12 , H04L29/08 , H01L29/786 , H01L29/423 , H01L29/51 , G06F1/26 , H02J13/00 , H04L12/24 , H04L12/853 , H04Q9/02
摘要: According to one embodiment, a semiconductor device includes an insulating substrate, a first semiconductor layer formed of silicon and positioned above the insulating substrate, a second semiconductor layer formed of a metal oxide and positioned above the first semiconductor layer, a first insulating film formed of a silicon nitride and positioned between the first semiconductor layer and the second semiconductor layer, and a block layer positioned between the first semiconductor film and the second semiconductor layer, the block layer hydrogen diffusion of which is lower than that of the first insulating film.
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公开(公告)号:US20180342536A1
公开(公告)日:2018-11-29
申请号:US15978464
申请日:2018-05-14
申请人: Japan Display Inc.
发明人: Isao Suzumura , Hajime Watakabe , Akihiro Hanada , Hirokazu Watanabe , Yohei Yamaguchi , Marina Shiokawa , Ryotaro Kimura
IPC分类号: H01L27/12 , H01L29/786 , G02F1/1362 , G02F1/1368 , G02F1/1333
CPC分类号: H01L27/124 , G02F1/133305 , G02F1/134363 , G02F1/136209 , G02F1/136227 , G02F1/136286 , G02F1/1368 , G02F2001/136295 , G02F2202/104 , H01L27/1218 , H01L27/1225 , H01L27/1266 , H01L27/127 , H01L27/3248 , H01L27/3262 , H01L29/78603 , H01L29/78618 , H01L29/78633 , H01L29/78648 , H01L29/78678 , H01L29/7869
摘要: The purpose of the invention is to form a flexible display device where the substrate is made of resin, wherein the TFT can be annealed in high temperature; consequently, a reliability of the TFT is improved. The concrete measure is as follows. A display device having a pixel electrode and a TFT including a semiconductor layer on a substrate comprising: a source region of the semiconductor layer connects with a source electrode, a drain region of the semiconductor layer connects with a drain electrode; the pixel electrode connects with the source electrode; the drain electrode connects with a video signal line; a distance between the drain electrode and the substrate is smaller than a distance between the semiconductor and the substrate, the semiconductor layer is formed between the pixel electrode and the substrate.
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公开(公告)号:US20180286890A1
公开(公告)日:2018-10-04
申请号:US15923026
申请日:2018-03-16
申请人: Japan Display Inc.
发明人: Isao Suzumura , Yohei Yamaguchi , Hajime Watakabe , Akihiro Hanada , Hirokazu Watanabe , Marina Shiokawa
IPC分类号: H01L27/12 , H01L29/786 , H01L29/49 , H01L21/02 , H01L21/465 , H01L21/4763 , H01L29/66
摘要: The purpose of the invention is to improve reliability of the TFT of the oxide semiconductor. The invention is characterized as follows. A display device comprising: a substrate including a display area where plural pixels are formed, the pixel includes a first TFT of a first oxide semiconductor; a first gate insulating film is formed on the first oxide semiconductor, a gate electrode is formed on the first gate insulating film, an interlayer insulating film is formed over the gate electrode; the gate insulating film includes a first silicon oxide film, the gate electrode includes a first gate layer made of a second oxide semiconductor and a second gate layer made of metal or alloy; the interlayer insulating film has a first interlayer insulating film including a second silicon oxide film, and a second interlayer insulating film including a first aluminum oxide film on the first interlayer insulating film.
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公开(公告)号:US09911859B2
公开(公告)日:2018-03-06
申请号:US14944711
申请日:2015-11-18
申请人: Japan Display Inc.
IPC分类号: H01L29/10 , H01L29/786 , H01L29/66
CPC分类号: H01L29/7869 , H01L29/42384 , H01L29/4908 , H01L29/66969 , H01L29/78603 , H01L29/78606
摘要: According to one embodiment, a thin-film transistor and a method of manufacturing the same achieve size reduction of the thin-film transistor while using an oxide semiconductor layer. The oxide semiconductor layer includes a channel region, a source region, and a drain region. A gate electrode is arranged at a position spaced from the channel region of the oxide semiconductor layer so as to face the channel region. A source electrode is electrically connected to the source region of the oxide semiconductor layer. A drain electrode is electrically connected to the drain region of the oxide semiconductor layer. An undercoat layer adjoins the source region and the drain region of the oxide semiconductor layer. A hydrogen blocking layer has a hydrogen concentration lower than that in the undercoat layer and separates the undercoat layer and the channel region of the oxide semiconductor layer.
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公开(公告)号:US12108627B2
公开(公告)日:2024-10-01
申请号:US17533127
申请日:2021-11-23
申请人: Japan Display Inc.
发明人: Akihiro Hanada , Kentaro Miura , Hajime Watakabe , Ryo Onodera
IPC分类号: H01L27/32 , H01L51/56 , H10K59/121 , H10K59/126 , H10K71/00 , H01L27/12 , H01L29/786 , H10K59/12 , H10K59/123
CPC分类号: H10K59/1213 , H10K59/126 , H10K71/00 , H01L27/1225 , H01L27/1251 , H01L29/78618 , H01L29/78633 , H01L29/78675 , H01L29/7869 , H10K59/1201 , H10K59/123
摘要: A display device includes a first transistor having a first semiconductor layer, in which a first source region includes a first region in contact with a first source electrode, and a first drain region includes a second region in contact with a first drain electrode. The first source and drain regions, the first region, and the second region each include a first impurity element. In a region close to an interface between the first semiconductor layer and a first insulating layer, a concentration of the first impurity element included in the first and second regions is higher than a concentration of the first impurity element included in the first source region and the first drain region. A method of manufacturing a display device includes forming a first gate electrode and a light shielding layer on a first insulating layer, and forming a second semiconductor layer on the light shielding layer.
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公开(公告)号:US12068399B2
公开(公告)日:2024-08-20
申请号:US17511633
申请日:2021-10-27
申请人: Japan Display Inc.
发明人: Akihiro Hanada , Takuo Kaitoh , Ryo Onodera , Takashi Okada , Tomoyuki Ito , Toshiki Kaneko
IPC分类号: H01L29/66 , H01L21/385 , H01L27/12 , H01L29/786
CPC分类号: H01L29/66969 , H01L21/385 , H01L27/1225 , H01L29/7869
摘要: According to one embodiment, a method for manufacturing a semiconductor device, includes forming a first insulating film which covers a gate electrode, forming an island-shaped oxide semiconductor in contact with the first insulating film, forming a second insulating film which covers the oxide semiconductor, forming a source electrode in contact with the oxide semiconductor, forming a drain electrode in contact with the oxide semiconductor, forming a third insulating film which covers the source electrode and the drain electrode and forming a channel region between the source electrode and the drain electrode by supplying oxygen from the third insulating film to the oxide semiconductor via the second insulating film.
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公开(公告)号:US12025899B2
公开(公告)日:2024-07-02
申请号:US18349217
申请日:2023-07-10
申请人: Japan Display Inc.
IPC分类号: G02F1/1368 , G02F1/1334 , G02F1/1362 , H01L27/12
CPC分类号: G02F1/1368 , G02F1/1334 , G02F1/136286 , H01L27/1248
摘要: According to one embodiment, a display device includes a first substrate including a first transparent substrate, a switching element including an oxide semiconductor, an organic insulating film covering the switching element, a transparent electrode including a first aperture penetrating to an upper surface of the organic insulating film, an inorganic insulating film including a second aperture penetrating to the upper surface in the first aperture, and a pixel electrode electrically connected to the switching element, and a second substrate including a second transparent substrate and opposed to the first substrate.
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公开(公告)号:US11942484B2
公开(公告)日:2024-03-26
申请号:US17876063
申请日:2022-07-28
申请人: Japan Display Inc.
发明人: Akihiro Hanada , Hajime Watakabe , Kazufumi Watabe
IPC分类号: H01L27/12 , G06F1/26 , H02J13/00 , H04L41/069 , H04L47/2416 , H04L67/12 , H01L29/423 , H01L29/51 , H01L29/786 , H04Q9/02
CPC分类号: H01L27/1225 , G06F1/26 , H01L27/1237 , H01L27/1248 , H01L27/1251 , H02J13/00 , H02J13/00016 , H04L41/069 , H04L47/2416 , H04L67/12 , H01L29/42384 , H01L2029/42388 , H01L29/513 , H01L29/517 , H01L29/518 , H01L29/78606 , H01L29/78633 , H01L29/78675 , H01L29/7869 , H04Q9/02 , H04Q2209/826
摘要: A semiconductor device includes an insulating substrate, a first semiconductor layer formed of silicon and positioned above the insulating substrate, a second semiconductor layer formed of a metal oxide and positioned above the first semiconductor layer, a first insulating film formed of a silicon nitride and positioned between the first semiconductor layer and the second semiconductor layer, and a block layer positioned between the first semiconductor film and the second semiconductor layer, the block layer hydrogen diffusion of which is lower than that of the first insulating film.
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