Invention Grant
- Patent Title: Apparatus for testing hacking of vehicle electronic device
-
Application No.: US16480595Application Date: 2017-05-08
-
Publication No.: US11284262B2Publication Date: 2022-03-22
- Inventor: Cheolseung Kim , Byeongrim Jo , Seongsoo Kim , Heejo Lee , Choongin Lee , Donghyeok Kim
- Applicant: LG ELECTRONICS INC. , KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION
- Applicant Address: KR Seoul; KR Seoul
- Assignee: LG ELECTRONICS INC.,KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION
- Current Assignee: LG ELECTRONICS INC.,KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION
- Current Assignee Address: KR Seoul; KR Seoul
- Agency: Fish & Richardson P.C.
- Priority: KR10-2017-0010769 20170124
- International Application: PCT/KR2017/004778 WO 20170508
- International Announcement: WO2018/139708 WO 20180802
- Main IPC: H04L9/00
- IPC: H04L9/00 ; H04W12/12 ; G06F21/57 ; H04L43/50 ; H04L69/22 ; H04L67/12 ; H04W84/12

Abstract:
A vehicular electronic device hacking test apparatus includes a transmitter, a receiver, and a processor configured to classify a communication-connection procedure into a plurality of states based on a preset communication protocol, to generate a mutated packet appropriate for the plurality of states, and to transmit a vehicular electronic device through the transmitter, and to determine whether the vehicular electronic device is vulnerable to hacking based on whether a reception packet corresponding to the mutated packet is received through the receiver.
Public/Granted literature
- US20190394652A1 APPARATUS FOR TESTING HACKING OF VEHICLE ELECTRONIC DEVICE Public/Granted day:2019-12-26
Information query