Invention Grant
- Patent Title: Temperature-compensated strain gauge measurements
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Application No.: US16941570Application Date: 2020-07-29
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Publication No.: US11287347B2Publication Date: 2022-03-29
- Inventor: Paul Szasz , Andreas Decker
- Applicant: ABB Schweiz AG
- Applicant Address: CH Baden
- Assignee: ABB Schweiz AG
- Current Assignee: ABB Schweiz AG
- Current Assignee Address: CH Baden
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: EP19189371 20190731
- Main IPC: G01L9/06
- IPC: G01L9/06 ; G01L9/04 ; G01L27/00 ; G01L9/02 ; G01L19/00

Abstract:
A device for measuring a strain of an object independently of temperature variations includes: at least one strain gauge that is attachable directly or indirectly to the object whose strain is to be measured; a first temperature sensor for measuring a temperature of the at least one strain gauge; read-out electronics for measuring a change of electrical resistance of the at least one strain gauge as a measured electrical resistance change, the read-out electronics including at least one fixed resistor whose value is relied upon when obtaining a value of the change of electrical resistance of the strain gauge as a result of the measurement, the read-out electronics being such that a temperature of the at least one fixed resistor is known and/or obtainable by measurement; and an evaluation unit for: correcting the measured electrical resistance change, and/or a strain of the strain gauge and/or the strain of the object.
Public/Granted literature
- US20210033481A1 TEMPERATURE-COMPENSATED STRAIN GAUGE MEASUREMENTS Public/Granted day:2021-02-04
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