发明授权
- 专利标题: X-ray examination arrangement and method for operating an x-ray examination arrangement
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申请号: US16798348申请日: 2020-02-22
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公开(公告)号: US11298089B2公开(公告)日: 2022-04-12
- 发明人: Marco Erler , Daniel Weiss , Martin Krenkel , Wolfgang Kimmig
- 申请人: Carl Zeiss Industrielle Messtechnik GmbH
- 申请人地址: DE Oberkochen
- 专利权人: Carl Zeiss Industrielle Messtechnik GmbH
- 当前专利权人: Carl Zeiss Industrielle Messtechnik GmbH
- 当前专利权人地址: DE Oberkochen
- 代理机构: Ewers IP Law PLLC
- 代理商 Falk Ewers
- 优先权: DE102019202452.1 20190222
- 主分类号: A61B6/00
- IPC分类号: A61B6/00 ; A61B6/03
摘要:
An x-ray examination arrangement includes an x-ray radiation source arranged at a source position, at least two x-ray detectors having active detector areas and being arranged such that the active detector areas capture different solid angle ranges with respect to x-ray radiation produced by the x-ray radiation source and emanating from the source position, and a control device configured to calculate a projection onto a virtual detector plane based on radiographs respectively captured by the at least two x-ray detectors and spatial poses of the at least two x-ray detectors relative to the source position, and provide a combined radiograph for the virtual detector plane based on the projection. In addition, a method for operating the x-ray examination arrangement and a computed tomography device are provided.
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