Invention Grant
- Patent Title: Accurate water cut measurement
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Application No.: US14746999Application Date: 2015-06-23
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Publication No.: US11300531B2Publication Date: 2022-04-12
- Inventor: Peter Bendel
- Applicant: ASPECT AI LTD.
- Applicant Address: IL Shoham
- Assignee: ASPECT AI LTD.
- Current Assignee: ASPECT AI LTD.
- Current Assignee Address: IL Shoham
- Agency: Loeb & Loeb LLP
- Main IPC: G01N24/08
- IPC: G01N24/08 ; E21B49/00 ; G01R33/44 ; G01V3/32

Abstract:
A method of incorporating the influence of diffusion into the CPMG-based T2 measurement for one or more of the following: water cut measurement; performing inline measurements of flow rate; density; and rheology of a flowing fluid. The method includes conducting a “standard T1/T2 experiment” at least twice by providing one scan without a field gradient during the CMPG echo train. Then, providing a second scan with the application of a gradient, where in the second experiment the measured T2 (T2app) is affected solely by water diffusion, thus shifting cross peaks which represent water on the first T1/T2 spectrum to lower T2 values on the second spectrum.
Public/Granted literature
- US20150377998A1 ACCURATE WATER CUT MEASUREMENT Public/Granted day:2015-12-31
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