公开(公告)号：US11300531B2

公开(公告)日：2022-04-12

申请号：US14746999

申请日：2015-06-23

Applicant: ASPECT AI LTD.

Inventor： Peter Bendel

IPC: G01N24/08 ,  E21B49/00 ,  G01R33/44 ,  G01V3/32

Abstract: A method of incorporating the influence of diffusion into the CPMG-based T2 measurement for one or more of the following: water cut measurement; performing inline measurements of flow rate; density; and rheology of a flowing fluid. The method includes conducting a “standard T1/T2 experiment” at least twice by providing one scan without a field gradient during the CMPG echo train. Then, providing a second scan with the application of a gradient, where in the second experiment the measured T2 (T2app) is affected solely by water diffusion, thus shifting cross peaks which represent water on the first T1/T2 spectrum to lower T2 values on the second spectrum.