Invention Grant
- Patent Title: Device structure and method for manufacturing the same
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Application No.: US16590173Application Date: 2019-10-01
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Publication No.: US11302619B2Publication Date: 2022-04-12
- Inventor: Wen Hung Huang
- Applicant: Advanced Semiconductor Engineering, Inc.
- Applicant Address: TW Kaohsiung
- Assignee: Advanced Semiconductor Engineering, Inc.
- Current Assignee: Advanced Semiconductor Engineering, Inc.
- Current Assignee Address: TW Kaohsiung
- Agency: Foley & Lardner LLP
- Main IPC: H01L21/48
- IPC: H01L21/48 ; H01L23/498 ; H05K1/11 ; H01L49/02 ; H01L23/00 ; H01L23/31 ; H01L25/16 ; H05K1/18 ; H05K1/16

Abstract:
A device structure includes a stacked structure, a dielectric material, and an electrode via. The stacked structure includes a first metal oxide layer, a second metal oxide layer and a metal layer. The second metal oxide layer is opposite to the first metal oxide layer. The metal layer is interposed between the first metal oxide layer and the second metal oxide layer. The dielectric material extends through the first metal oxide layer. The electrode via extends through the dielectric material and electrically connected to the metal layer.
Public/Granted literature
- US20210098357A1 DEVICE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2021-04-01
Information query
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