Invention Grant
- Patent Title: Memory device having improved data reliability by varying program sequences
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Application No.: US17141408Application Date: 2021-01-05
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Publication No.: US11315646B2Publication Date: 2022-04-26
- Inventor: Seung-Bum Kim , Min-Su Kim , Deok-Woo Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Volentine, Whitt & Francos, PLLC
- Priority: KR10-2018-0037763 20180330
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C16/12 ; G11C16/24 ; G11C16/08

Abstract:
A memory device includes: a memory cell array; a control logic circuit; and a row decoder. The row decoder is configured to activate string selection lines based on control of the control logic circuit. A program interval is formed between a first program operation and a second program operation. The control logic circuit includes a reprogram controller configured to control the row decoder so that a program interval differs in the memory cells connected to different string selection lines among the memory cells connected to a first wordline.
Public/Granted literature
- US20210125676A1 MEMORY DEVICE HAVING IMPROVED DATA RELIABILITY AND METHOD OF OPERATING THE SAME Public/Granted day:2021-04-29
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